Exposure correction using deep learning.

Jing Wang Xiongfei Li Zeyu Wang Haoran Duan Xiaoli Zhang

Published in: J. Electronic Imaging (2019)

Keyphrases

deep learning
unsupervised learning
machine learning
unsupervised feature learning
electron beam lithography
deep architectures
deep belief networks
weakly supervised
decision trees
pattern recognition
mental models
restricted boltzmann machine
data mining
learning algorithm
viewpoint
information extraction