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High Bit Cost Scalability and Reliable Cell Characteristics for 7th Generation 1Tb 4Bit/Cell 3D-NAND Flash.

Kyungmoon KimYujeong SeoSejun ParkWoojae JangDongho YooJoonsung LimIl-Han ParkJaeduk LeeKyungyoon NohSujin AhnSunghoi Hur
Published in: VLSI Technology and Circuits (2023)
Keyphrases
  • wide range
  • microscopic images
  • high cost
  • inter cell
  • high precision
  • microscope images
  • living cells
  • immune response