Counterfeit Chip Detection using Scattering Parameter Analysis.

Maryam Saadat-Safa Tahoura Mosavirik Shahin Tajik

Published in: DDECS (2023)

Keyphrases

low cost
event detection
real world
three dimensional
image analysis
digital images
object detection
reliable detection
database
automatic analysis
high density
false positives
statistical analysis
data analysis
information systems
computer vision
neural network
real time