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Vietoris-Rips and Cech Complexes of Metric Gluings.

Michal AdamaszekHenry AdamsEllen GasparovicMaria GommelEmilie PurvineRadmila SazdanovicBei WangYusu WangLori Ziegelmeier
Published in: SoCG (2018)
Keyphrases
  • distance metric
  • metric space
  • database
  • databases
  • similarity metric
  • metric learning
  • real time
  • neural network
  • image quality
  • high precision
  • critical points
  • quality metrics
  • color quantization