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Vietoris-Rips and Cech Complexes of Metric Gluings.
Michal Adamaszek
Henry Adams
Ellen Gasparovic
Maria Gommel
Emilie Purvine
Radmila Sazdanovic
Bei Wang
Yusu Wang
Lori Ziegelmeier
Published in:
SoCG (2018)
Keyphrases
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distance metric
metric space
database
databases
similarity metric
metric learning
real time
neural network
image quality
high precision
critical points
quality metrics
color quantization