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Power and Thermal Constrained Test Scheduling Under Deep Submicron Technologies.
Chunhua Yao
Kewal K. Saluja
Parameswaran Ramanathan
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2011)
Keyphrases
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scheduling problem
scheduling algorithm
power consumption
utility computing
data mining
genetic algorithm
infrared
emerging technologies
vlsi circuits
real time
neural network
flexible manufacturing systems
electrical power