Formal proof and test case generation for critical embedded systems using SCADE.
Guy DurrieuOdile LaurentChristel SeguinVirginie WielsPublished in: IFIP Congress Topical Sessions (2004)
Keyphrases
- embedded systems
- formal proof
- test case generation
- test cases
- low cost
- computing power
- object oriented systems
- software testing
- embedded devices
- embedded software
- real time systems
- resource limited
- software systems
- theorem prover
- test data generation
- hw sw
- consumer electronics
- databases
- embedded real time systems
- field programmable gate array
- software development
- source code
- search algorithm