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Adaptive Under-Sampling Deep Neural Network for Rapid and Reliable Image Recovery in Confocal Laser Scanning Microscope Measurements.

Jim-Wei WuKuang-Yao ChangLi-Chen Fu
Published in: IEEE Trans. Instrum. Meas. (2022)
Keyphrases
  • laser scanning
  • image recovery
  • neural network
  • visual inspection
  • coordinate ascent
  • three dimensional
  • microscopy images
  • high resolution
  • compressive sensing
  • pattern recognition
  • convex sets
  • face recognition
  • multiscale