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Anti-ESD impacts on 60-V P-channel LDMOS devices as none-ODs zone inserting in the bulk region.
Shen-Li Chen
Shawn Chang
Yu-Ting Huang
Shun-Bao Chang
Published in:
ICCE-TW (2015)
Keyphrases
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multi channel
mobile devices
image regions
low cost
region of interest
multiple access
database
smart phones
processing capabilities
boundary information