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Anti-ESD impacts on 60-V P-channel LDMOS devices as none-ODs zone inserting in the bulk region.

Shen-Li ChenShawn ChangYu-Ting HuangShun-Bao Chang
Published in: ICCE-TW (2015)
Keyphrases
  • multi channel
  • mobile devices
  • image regions
  • low cost
  • region of interest
  • multiple access
  • database
  • smart phones
  • processing capabilities
  • boundary information