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A 290-mV, 7-nm Ultra-Low-Voltage One-Port SRAM Compiler Design Using a 12T Write Contention and Read Upset Free Bit-Cell.

Mahmut E. SinangilYen-Ting LinHung-Jen LiaoJonathan Chang
Published in: IEEE J. Solid State Circuits (2019)
Keyphrases
  • low voltage
  • cmos technology
  • random access memory
  • design considerations
  • high speed
  • data management
  • power consumption
  • low power
  • image processing
  • design methodology
  • power reduction