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Actual Reasons Involving Turn-Off Losses Improvement With Increasing Load and Gate Resistance in MOSFETs Enhanced With Kelvin Source.
Santi Agatino Rizzo
Nunzio Salerno
Published in:
IEEE Trans. Ind. Electron. (2024)
Keyphrases
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low voltage
significant improvement
load balancing
real time
active power
leakage current
multiple input
nano scale
database
learning algorithm
online learning
cmos technology