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ALADIN: a multilevel testability analyzer for VLSI system design.

Massimo BombanaGiacomo BuonannoPatrizia CavalloroFabrizio FerrandiDonatella SciutoGiuseppe Zaza
Published in: IEEE Trans. Very Large Scale Integr. Syst. (1994)
Keyphrases
  • design process
  • case study
  • data mining
  • engineering design
  • design tools
  • design space
  • vlsi design
  • database
  • image processing
  • website
  • knowledge based systems
  • conceptual model
  • single chip