Mixed-Type Wafer Failure Pattern Recognition.
Hao GengQi SunTinghuan ChenQi XuTsung-Yi HoBei YuPublished in: ASP-DAC (2023)
Keyphrases
- pattern recognition
- neural network
- signal processing
- image processing
- machine learning
- integrated circuit
- pattern classification
- image analysis
- semiconductor manufacturing
- database
- support vector machine svm
- fuzzy sets
- multiresolution
- artificial neural networks
- video sequences
- information systems
- computer vision
- artificial intelligence
- databases