Characterization of Artifact Influence on the Classification of Glucose Time Series Using Sample Entropy Statistics.
David Cuesta-FrauDaniel NovákVaclav BurdaAntonio Molina-PicóBorja VargasMilos MrazPetra KavalkovaMarek BenesMartin HaluzikPublished in: Entropy (2018)
Keyphrases
- pattern recognition
- small sample
- support vector machine
- decision trees
- feature selection
- classification process
- classification scheme
- pattern classification
- image classification
- classification accuracy
- support vector
- machine learning
- text classification
- cost sensitive
- supervised learning
- feature extraction
- classification systems
- automatic classification
- classification models
- classification rules
- classification algorithm
- unsupervised learning
- feature vectors
- information theory
- high dimensional
- classification method
- classification rate
- cross validation
- statistical modeling
- information entropy