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Embedded test resource for SoC to reduce required tester channels based on advanced convolutional codes.

Yinhe HanXiaowei LiHuawei LiAnshuman Chandra
Published in: IEEE Trans. Instrum. Meas. (2006)
Keyphrases
  • resource allocation
  • bit errors
  • hidden markov models
  • digital images
  • image coding
  • information theoretic
  • end to end
  • markov model
  • convolutional codes