Early detection and repair of VRT and aging DRAM bits by margined in-field BIST.
Bendik KlevelandJeong ChoiJeff KumalaPascal AdamPatrick ChenRajesh ChopraAntonio CruzRonald B. DavidAshish DixitSinan DolucaMark HendricksonBen LeeMing LiuMichael John MillerMike MorrisonByeong Cheol NaJay PatelDipak K. SikdarMichael SporerClement SzetoAnju TsaoJianguang WangDaniel YauWesley YuPublished in: VLSIC (2014)