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A Deep Learning Method for PCB Defect Detection Based on Improved Yolov8.

Panke ZhuYiwen CaiFen LiJing KanKewei ChenFangyan Dong
Published in: CVDL (2024)
Keyphrases
  • defect detection
  • deep learning
  • pattern recognition
  • feature extraction
  • pairwise
  • similarity measure
  • higher order
  • unsupervised learning
  • segmentation method