On-Wafer Measurement of Transistor Noise Parameters at NIST.
James RandaDavid K. WalkerPublished in: IEEE Trans. Instrum. Meas. (2007)
Keyphrases
- integrated circuit
- high speed
- measurement error
- random noise
- noise level
- parameter settings
- weak signal detection
- real time
- image noise
- noisy data
- input data
- neural network
- parameter values
- image restoration
- noise model
- parameter estimation
- noisy environments
- image statistics
- noise variance
- edge detection
- semiconductor manufacturing