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Topic-based software defect explanation.
Tse-Hsun Chen
Weiyi Shang
Meiyappan Nagappan
Ahmed E. Hassan
Stephen W. Thomas
Published in:
J. Syst. Softw. (2017)
Keyphrases
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software defect
software defect prediction
high confidence
confidence estimates
data sets
neural network
multi class
test data
ensemble learning