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Topic-based software defect explanation.

Tse-Hsun ChenWeiyi ShangMeiyappan NagappanAhmed E. HassanStephen W. Thomas
Published in: J. Syst. Softw. (2017)
Keyphrases
  • software defect
  • software defect prediction
  • high confidence
  • confidence estimates
  • data sets
  • neural network
  • multi class
  • test data
  • ensemble learning