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Reducing the Soft-Error Rate of a High-Performance Microprocessor.

Christopher T. WeaverJoel S. EmerShubhendu S. MukherjeeSteven K. Reinhardt
Published in: IEEE Micro (2004)
Keyphrases
  • error rate
  • test set
  • lower error rates
  • high speed
  • rule sets
  • misclassification rate
  • text entry
  • false discovery rate
  • pattern recognition
  • power consumption
  • training error
  • word error rate
  • embedded dram