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Non-contact Testing for SoC and RCP (SIPs) at Advanced Nodes.

Brian MooreMarc MangrumChris SellathambyMd. Mahbub RejaT. WengBrenda BaiEdwin Walter ReidIgor M. FilanovskySteven Slupsky
Published in: ITC (2008)
Keyphrases
  • shortest path
  • test cases
  • minimum cost
  • software testing
  • hardware software co design
  • neural network
  • information systems
  • search algorithm
  • directed graph
  • weighted graph