Login / Signup

Defect Analysis and Cost-Effective Resilience Architecture for Future DRAM Devices.

Sang-uhn ChaSeongil OHyunsung ShinSangjoon HwangKwang-Il ParkSeong-Jin JangJoo-Sun ChoiGyo-Young JinYoung Hoon SonHyunyoon ChoJung Ho AhnNam Sung Kim
Published in: HPCA (2017)
Keyphrases
  • cost effective
  • low cost
  • statistical analysis
  • data center
  • data analysis
  • cost effectiveness
  • data model
  • embedded systems