Explainable AI for domain experts: a post Hoc analysis of deep learning for defect classification of TFT-LCD panels.
Minyoung LeeJoohyoung JeonHongchul LeePublished in: J. Intell. Manuf. (2022)
Keyphrases
- domain experts
- deep learning
- defect classification
- tft lcd
- machine learning
- knowledge acquisition
- domain knowledge
- domain specific
- artificial intelligence
- thin film transistor
- goal programming
- post hoc analysis
- unsupervised learning
- expert systems
- stock price
- knowledge base
- knowledge representation
- knowledge based systems
- supply chain
- mental models
- control group
- training data
- weakly supervised
- liquid crystal displays
- computer vision