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Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions.

Takayuki HisakaHajime SasakiYoichi NogamiKenji HosogiNaohito YoshidaAnita A. VillanuevaJesús A. del AlamoShigehiko HasegawaHajime Asahi
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • wide range
  • databases
  • sufficient conditions
  • database
  • case study
  • multiscale
  • data acquisition
  • significantly lower
  • room temperature