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High-K Gate Dielectric GaN MOS-HEMTs with Regrown n+ InGaN Source/Drain (Invited Paper).
Han Wui Then
Sansaptak Dasgupta
Marko Radosavljevic
Sanaz Gardner
Seung-Hoon Sung
Paul Fischer
Published in:
DRC (2019)
Keyphrases
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invited paper
neural network
database
context aware
early warning
gate dielectrics