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High-K Gate Dielectric GaN MOS-HEMTs with Regrown n+ InGaN Source/Drain (Invited Paper).

Han Wui ThenSansaptak DasguptaMarko RadosavljevicSanaz GardnerSeung-Hoon SungPaul Fischer
Published in: DRC (2019)
Keyphrases
  • invited paper
  • neural network
  • database
  • context aware
  • early warning
  • gate dielectrics