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CMAC-based modelling for HPDDL welding process control.

Peiyong DuanYu Ming Zhang
Published in: Int. J. Model. Identif. Control. (2006)
Keyphrases
  • process control
  • control system
  • intelligent control
  • product quality
  • semiconductor manufacturing
  • remote control
  • manufacturing process
  • data sets
  • nonlinear systems
  • learning speed
  • petri net