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A scan-based attack on Elliptic Curve Cryptosystems in presence of industrial Design-for-Testability structures.
Jean DaRolt
Amitabh Das
Giorgio Di Natale
Marie-Lise Flottes
Bruno Rouzeyre
Ingrid Verbauwhede
Published in:
DFT (2012)
Keyphrases
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elliptic curve
industrial design
power analysis
scalar multiplication
key agreement
elliptic curve cryptography
diffie hellman
digital signature
efficient computation
public key cryptography
modular exponentiation
public key cryptosystems
data streams
java card
key management
countermeasures
data objects