Scalable Short-Open-Interconnect S-Parameter De-Embedding Method for On-Wafer Microwave Characterization of Silicon MOSFETs.
Ming-Hsiang ChoYueh-Hua WangLin-Kun WuPublished in: IEICE Trans. Electron. (2007)
Keyphrases
- semi supervised
- pairwise
- experimental evaluation
- computational cost
- segmentation method
- high accuracy
- face recognition
- detection method
- significant improvement
- classification method
- edge detection
- data embedding
- parameter settings
- parameter space
- synthetic data
- clustering method
- segmentation algorithm
- high speed
- probabilistic model
- cost function
- preprocessing
- objective function