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Preparation, Characterization, Insulation Study of Al2O3 Thin Film Deposited by Dual Ion Beam Sputtering.

Xingkai LinYanlei WangGuifu DingCongchun Zhang
Published in: NEMS (2018)
Keyphrases
  • thin film
  • film thickness
  • databases
  • neural nets
  • magnetic field
  • electron microscopy
  • short circuit