Login / Signup

Ageing and thermal recovery of advanced SiGe heterojunction bipolar transistors under long-term mixed-mode and reverse stress conditions.

G. G. FischerGrazia Sasso
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • mixed mode
  • long term
  • high density
  • short term
  • thin film
  • infrared
  • power consumption
  • real world
  • data analysis
  • finite element analysis
  • dual channel