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Ageing and thermal recovery of advanced SiGe heterojunction bipolar transistors under long-term mixed-mode and reverse stress conditions.
G. G. Fischer
Grazia Sasso
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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mixed mode
long term
high density
short term
thin film
infrared
power consumption
real world
data analysis
finite element analysis
dual channel