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A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects.
Kuen-Yu Tsai
Meng-Fu You
Yi-Chang Lu
Philip C. W. Ng
Published in:
ICCAD (2008)
Keyphrases
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high accuracy
error rate
high precision
computational cost
estimation accuracy
image processing
classification accuracy
digital images
low power