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Advanced thermal sensing circuit and test techniques used in a high performance 65nm processor.
David E. Duarte
Greg Taylor
Keng L. Wong
Usman Mughal
George L. Geannopoulos
Published in:
ISLPED (2007)
Keyphrases
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high speed
real time
distributed memory
sensor networks
infrared
cmos technology
test cases
parallel processing
circuit design
input output
parallel algorithm
power consumption
analog circuits
logic circuits
power reduction