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A Parallel Transitive Closure Computation Algorithm for VLSI Test Generation.

Seema BawaG. K. Sharma
Published in: PARA (2002)
Keyphrases
  • transitive closure
  • learning algorithm
  • knowledge base
  • expert systems
  • probabilistic model
  • tree structure
  • database systems
  • data analysis
  • probability distribution
  • first order logic
  • matching algorithm