Random Pattern Testable Design with Partial Circuit Duplication.

Hiroshi Yokoyama Xiaoqing Wen Hideo Tamamoto

Published in: Asian Test Symposium (1997)

Keyphrases

circuit design
data sets
case study
database systems
design principles
design space
electronic circuits
information retrieval
genetic algorithm
data structure
learning environment
high speed
pattern matching
software architecture
engineering design
design tools