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Defect-Tolerant FPGA Switch Block and Connection Block with Fine-Grain Redundancy for Yield Enhancement.

Anthony J. YuGuy G. Lemieux
Published in: FPL (2005)
Keyphrases
  • fine grain
  • coarse grain
  • high speed
  • real time
  • query processing
  • parallel computation
  • general purpose
  • graphical models