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Test Pattern Generation for Multiple Aggressor Crosstalk Effects Considering Gate Leakage Loading in Presence of Gate Delays.
Alodeep Sanyal
Kunal P. Ganeshpure
Sandip Kundu
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2012)
Keyphrases
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multiple input
field effect transistors
nano scale
leakage current
genetic algorithm
search engine
information systems
multimedia
website
image segmentation
three dimensional
data structure
steady state
correlation analysis
computer based instruction