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Frequency scaled segmented (FSS) scan architecture for optimized scan-shift power and faster test application time.

W. PradeepP. NarayananR. MittalN. MaheshwariN. Naresh
Published in: ITC (2017)
Keyphrases
  • power consumption
  • real time
  • management system
  • test cases
  • key technologies
  • application specific
  • feature subset selection
  • cross platform