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Effect of High-Temperature Bake on RTN Statistics in Floating Gate Flash Memory Arrays.
Viktor Markov
Gilles Festes
Louisa Schneider
Steven Lemke
Serguei Jourba
Alexander Kotov
Published in:
IMW (2023)
Keyphrases
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high temperature
flash memory
solid state
garbage collection
disk drives
random access
main memory
file system
database systems
neural network
multi dimensional
embedded systems
data storage
storage devices
floating gate
databases