Stochastic Testing Method for Transistor-Level Uncertainty Quantification Based on Generalized Polynomial Chaos.
Zheng ZhangTarek A. El-MoselhyIbrahim M. ElfadelLuca DanielPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2013)
Keyphrases
- high accuracy
- significant improvement
- cost function
- detection method
- computational complexity
- computational cost
- classification method
- dynamic programming
- objective function
- high speed
- test data
- neural network
- preprocessing
- missing data
- optimization algorithm
- high precision
- parameter estimation
- model selection
- support vector machine
- probabilistic model
- prior knowledge
- k means
- artificial neural networks
- pairwise