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Impact of within-wafer process variability on radiation response.

Zhiyuan HuZhangli LiuHua ShaoZhengxuan ZhangBingxu NingMing ChenDawei BiShichang Zou
Published in: Microelectron. J. (2011)
Keyphrases
  • multiresolution
  • infrared
  • process model
  • data mining
  • website
  • three dimensional