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Geomorphometry and microelectronic metrology: Converged realms.

Anna A. DedkovaIgor V. Florinsky
Published in: Trans. GIS (2023)
Keyphrases
  • camera calibration
  • thin film
  • single view
  • process control
  • machine learning
  • computer vision
  • artificial neural networks
  • fuzzy logic
  • single image
  • learning algorithm
  • image data
  • neural nets
  • semiconductor manufacturing