A parallel built-in self-diagnostic method for embedded memoryarrays.
Der-Cheng HuangWen-Ben JonePublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2002)
Keyphrases
- detection method
- main contribution
- classification method
- synthetic data
- classification accuracy
- parallel implementation
- fully automatic
- high precision
- clustering method
- computationally efficient
- computational cost
- experimental evaluation
- similarity measure
- detection algorithm
- support vector machine
- optical flow
- objective function
- feature selection