Login / Signup

Reliability of large periphery GaN-on-Si HFETs.

S. SinghalT. LiA. ChaudhariA. W. HansonRobert J. TherrienJ. W. JohnsonW. NagyJ. MarquartP. RajagopalJohn C. Roberts
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • multiscale
  • highly reliable
  • real time
  • reliability analysis
  • databases
  • neural network
  • genetic algorithm
  • artificial intelligence
  • web pages
  • clustering algorithm
  • case study
  • learning environment
  • evolutionary algorithm