Bayesian Methods for Planning Accelerated Repeated Measures Degradation Tests.

Brian P. Weaver William Q. Meeker

Published in: Technometrics (2021)

Keyphrases

bayesian methods
repeated measures
bayesian framework
model selection
gaussian processes
machine learning
hyperparameters
statistical analyses
control group
learning environment
statistical analysis
computer simulation
statistically significant
machine learning methods
computer technology
statistical tests