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Effect of 805 nm on reliability of 735/805/850-nm LED involved near-infrared spectroscopy biomedical device.

Yue ZhaoLina QiuKe ZhaoKai LiYunlong SunLingkang MengZhe HuangTing Li
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • quantitative analysis
  • three dimensional
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  • metal oxide semiconductor
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  • force feedback
  • metal oxide