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Surge Capability Testing of Supercapacitor Families Using a Lightning Surge Simulator.

Nihal KularatnaJayathu FernandoAmit PandeySisira James
Published in: IEEE Trans. Ind. Electron. (2011)
Keyphrases
  • short term
  • information retrieval
  • test cases
  • neural network
  • knowledge base
  • multiscale
  • evolutionary algorithm
  • hidden markov models
  • test set