Login / Signup
Endurance-Limited Memories: Capacity and Codes.
Yeow Meng Chee
Michal Horovitz
Alexander Vardy
Van Khu Vu
Eitan Yaakobi
Published in:
CoRR (2021)
Keyphrases
</>
error correction
data sets
associative memory
image processing
artificial neural networks
mobile devices
signal to noise ratio
short term memory