Combining an adapted wavelet analysis with fourth-order statistics for transient detection.
Philippe RavierPierre-Olivier AmblardPublished in: Signal Process. (1998)
Keyphrases
- wavelet analysis
- fourth order
- noise removal
- high order
- partial differential equations
- multiresolution
- factor analysis
- wavelet transform
- anisotropic diffusion
- image interpolation
- basis functions
- detection algorithm
- nonlinear diffusion
- feature detection
- low frequency
- high quality
- image enhancement
- computer vision
- feature selection
- feature space
- high frequency
- natural images