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Quality Assessment Model for Critical Manufacturing Process of Crystal Oscillator.
Kuen-Suan Chen
Ching-Hsin Wang
Yun-Tsan Lin
Chun-Min Yu
Hui-Min Shih
Published in:
IEA/AIE (2013)
Keyphrases
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quality assessment
manufacturing process
image quality
mathematical model
discrete event
data mining
high level
multiscale
control system
knowledge discovery
image data