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A Design-Oriented Soft Error Rate Variation Model Accounting for Both Die-to-Die and Within-Die Variations in Submicrometer CMOS SRAM Cells.

Hassan MostafaMohab AnisMohamed I. Elmasry
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2010)
Keyphrases
  • error rate
  • probabilistic model
  • test set
  • user interface
  • low cost
  • high speed
  • low power
  • misclassification rate