Power and Thermal Cycling Testbed for End of Life Assessment of Semiconductor Devices.

Margo Molenaar Faezeh Kardan Aditya Shekhar Pavol Bauer

Published in: IECON (2023)

Keyphrases

semiconductor devices
electron beam
power consumption
electrical power
infrared
neural network
daily life
transmission line
database systems
reinforcement learning
mathematical model